Determination of X-ray flux using silicon pin diodes
Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here...
Main Authors: | Owen, R, Holton, J, Schulze-Briese, C, Garman, E |
---|---|
Format: | Journal article |
Jezik: | English |
Izdano: |
International Union of Crystallography
2009
|
Teme: |
Podobne knjige/članki
-
Radiation damage in protein crystals examined under various conditions by different methods
od: Garman, E, et al.
Izdano: (2009) -
Determination of X-ray flux using silicon pin diodes.
od: Owen, R, et al.
Izdano: (2009) -
Pushing the boundaries: molecular dynamics simulations of complex biological membranes
od: Parton, D
Izdano: (2011) -
Structural studies on determinants of receptor/ligand binding in the tumour necrosis factor and T cell receptor protein families
od: Marles-Wright, J
Izdano: (2005) -
Structural studies on determinants of receptor/ligand binding in the tumour necrosis factor and T cell receptor protein families
od: Marles-Wright, J
Izdano: (2005)