Determination of X-ray flux using silicon pin diodes
Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here...
Автори: | Owen, R, Holton, J, Schulze-Briese, C, Garman, E |
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Формат: | Journal article |
Мова: | English |
Опубліковано: |
International Union of Crystallography
2009
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Предмети: |
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