Determination of X-ray flux using silicon pin diodes
Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here...
| Автори: | , , , |
|---|---|
| Формат: | Journal article |
| Мова: | English |
| Опубліковано: |
International Union of Crystallography
2009
|
| Предмети: |
Search Result 1
