High dose efficiency atomic resolution imaging via electron ptychography
Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than co...
| Main Authors: | , , , |
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| Format: | Journal article |
| Jezik: | English |
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Elsevier
2018
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| _version_ | 1826302253664829440 |
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| author | Pennycook, TJ Martinez, GT Nellist, PD Meyer, JC |
| author_facet | Pennycook, TJ Martinez, GT Nellist, PD Meyer, JC |
| author_sort | Pennycook, TJ |
| collection | OXFORD |
| description | Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset. |
| first_indexed | 2024-03-07T05:44:46Z |
| format | Journal article |
| id | oxford-uuid:e6d9938a-62ed-4ef8-ac4e-daf67c2bc577 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T05:44:46Z |
| publishDate | 2018 |
| publisher | Elsevier |
| record_format | dspace |
| spelling | oxford-uuid:e6d9938a-62ed-4ef8-ac4e-daf67c2bc5772022-03-27T10:33:54ZHigh dose efficiency atomic resolution imaging via electron ptychographyJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e6d9938a-62ed-4ef8-ac4e-daf67c2bc577EnglishSymplectic Elements at OxfordElsevier2018Pennycook, TJMartinez, GTNellist, PDMeyer, JCRadiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than conventional and spherical aberration optimized phase contrast imaging, resulting in significantly greater clarity at a given dose. This robustness is explained by the presence of achromatic lines in the four dimensional ptychographic dataset. |
| spellingShingle | Pennycook, TJ Martinez, GT Nellist, PD Meyer, JC High dose efficiency atomic resolution imaging via electron ptychography |
| title | High dose efficiency atomic resolution imaging via electron ptychography |
| title_full | High dose efficiency atomic resolution imaging via electron ptychography |
| title_fullStr | High dose efficiency atomic resolution imaging via electron ptychography |
| title_full_unstemmed | High dose efficiency atomic resolution imaging via electron ptychography |
| title_short | High dose efficiency atomic resolution imaging via electron ptychography |
| title_sort | high dose efficiency atomic resolution imaging via electron ptychography |
| work_keys_str_mv | AT pennycooktj highdoseefficiencyatomicresolutionimagingviaelectronptychography AT martinezgt highdoseefficiencyatomicresolutionimagingviaelectronptychography AT nellistpd highdoseefficiencyatomicresolutionimagingviaelectronptychography AT meyerjc highdoseefficiencyatomicresolutionimagingviaelectronptychography |