High dose efficiency atomic resolution imaging via electron ptychography

High dose efficiency atomic resolution imaging via electron ptychography

Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types of materials at high resolution. Here we evaluate the dose efficiency of phase contrast imaging with electron ptychography. The method is found to be far more resilient to temporal incoherence than co...

Полное описание

Библиографические подробности
Главные авторы:	Pennycook, TJ, Martinez, GT, Nellist, PD, Meyer, JC
Формат:	Journal article
Язык:	English
Опубликовано:	Elsevier 2018

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