APA引文

Javer, A., Rittscher, J., & Sailem, H. (2020). DeepScratch: Single-cell based topological metrics of scratch wound assays. Elsevier.

芝加哥风格引文

Javer, A., J. Rittscher, 与 HZ Sailem. DeepScratch: Single-cell Based Topological Metrics of Scratch Wound Assays. Elsevier, 2020.

MLA引文

Javer, A., et al. DeepScratch: Single-cell Based Topological Metrics of Scratch Wound Assays. Elsevier, 2020.

警告：这些引文格式不一定是100％准确.