Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale

Time-resolved and time-integrated microphotoluminescence studies at 4.2 K were performed on a single InGaN/GaN nanorod light emitting diode, fabricated in an array, on a wafer scale by nanoimprint lithography. Emission properties and carrier dynamics of the single nanorods are presented. Sharp peaks...

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Main Authors: Chan, C, Reid, B, Taylor, R, Zhuang, Y, Shields, P, Allsopp, D, Jia, W
Format: Journal article
Language:English
Published: 2013
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author Chan, C
Reid, B
Taylor, R
Zhuang, Y
Shields, P
Allsopp, D
Jia, W
author_facet Chan, C
Reid, B
Taylor, R
Zhuang, Y
Shields, P
Allsopp, D
Jia, W
author_sort Chan, C
collection OXFORD
description Time-resolved and time-integrated microphotoluminescence studies at 4.2 K were performed on a single InGaN/GaN nanorod light emitting diode, fabricated in an array, on a wafer scale by nanoimprint lithography. Emission properties and carrier dynamics of the single nanorods are presented. Sharp peaks of 2 meV line-width were observed. The single nanorods possess longer decay rates than an unprocessed wafer at delay-times above 50 ns after excitation. The time evolution of the photoluminescence spectra implies that the slower decay times are due to surface related localisation near the perimeter of the nanorods, resulting in a spatial separation of the recombining carriers at low excitation densities. © 2013 American Institute of Physics.
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spelling oxford-uuid:e7e2bc2c-5ab4-471b-aff0-a1e76723d2b42022-03-27T10:42:25ZOptical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scaleJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e7e2bc2c-5ab4-471b-aff0-a1e76723d2b4EnglishSymplectic Elements at Oxford2013Chan, CReid, BTaylor, RZhuang, YShields, PAllsopp, DJia, WTime-resolved and time-integrated microphotoluminescence studies at 4.2 K were performed on a single InGaN/GaN nanorod light emitting diode, fabricated in an array, on a wafer scale by nanoimprint lithography. Emission properties and carrier dynamics of the single nanorods are presented. Sharp peaks of 2 meV line-width were observed. The single nanorods possess longer decay rates than an unprocessed wafer at delay-times above 50 ns after excitation. The time evolution of the photoluminescence spectra implies that the slower decay times are due to surface related localisation near the perimeter of the nanorods, resulting in a spatial separation of the recombining carriers at low excitation densities. © 2013 American Institute of Physics.
spellingShingle Chan, C
Reid, B
Taylor, R
Zhuang, Y
Shields, P
Allsopp, D
Jia, W
Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
title Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
title_full Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
title_fullStr Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
title_full_unstemmed Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
title_short Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
title_sort optical studies of the surface effects from the luminescence of single gan ingan nanorod light emitting diodes fabricated on a wafer scale
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