Optical studies of the surface effects from the luminescence of single GaN/InGaN nanorod light emitting diodes fabricated on a wafer scale
Time-resolved and time-integrated microphotoluminescence studies at 4.2 K were performed on a single InGaN/GaN nanorod light emitting diode, fabricated in an array, on a wafer scale by nanoimprint lithography. Emission properties and carrier dynamics of the single nanorods are presented. Sharp peaks...
मुख्य लेखकों: | Chan, C, Reid, B, Taylor, R, Zhuang, Y, Shields, P, Allsopp, D, Jia, W |
---|---|
स्वरूप: | Journal article |
भाषा: | English |
प्रकाशित: |
2013
|
समान संसाधन
-
Photoluminescence of Single GaN/InGaN Nanorod Light Emitting Diode Fabricated on a Wafer Scale
द्वारा: Chan, C, और अन्य
प्रकाशित: (2013) -
Insight into the performance of multi-color InGaN/GaN nanorod light emitting diodes
द्वारा: Y. Robin, और अन्य
प्रकाशित: (2018-05-01) -
On the mechanisms of InGaN electron cooler in InGaN/GaN light-emitting diodes
द्वारा: Zhang, Xueliang, और अन्य
प्रकाशित: (2014) -
A hole accelerator for InGaN/GaN light-emitting diodes
द्वारा: Zhang, Zi-Hui, और अन्य
प्रकाशित: (2014) -
A hole modulator for InGaN/GaN light-emitting diodes
द्वारा: Zhang, Zi-Hui, और अन्य
प्रकाशित: (2015)