The application of statistical methodology to the analysis of time-resolved X-ray diffraction data
We demonstrate for the first time the application of Principal Component Analysis (PCA) to the analysis of time-resolved energy-dispersive X-ray diffraction data. Previously well-characterised model systems are studied. PCA is shown to offer significant advantages over traditional curve-fitting meth...
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| Format: | Journal article |
| Language: | English |
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2011
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| _version_ | 1826302519727357952 |
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| author | Burley, J O'Hare, D Williams, G |
| author_facet | Burley, J O'Hare, D Williams, G |
| author_sort | Burley, J |
| collection | OXFORD |
| description | We demonstrate for the first time the application of Principal Component Analysis (PCA) to the analysis of time-resolved energy-dispersive X-ray diffraction data. Previously well-characterised model systems are studied. PCA is shown to offer significant advantages over traditional curve-fitting methods in terms of speed and lack of potential user bias. © 2011 The Royal Society of Chemistry. |
| first_indexed | 2024-03-07T05:48:47Z |
| format | Journal article |
| id | oxford-uuid:e81eec9e-b714-4c29-b254-59b0c21d534d |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T05:48:47Z |
| publishDate | 2011 |
| record_format | dspace |
| spelling | oxford-uuid:e81eec9e-b714-4c29-b254-59b0c21d534d2022-03-27T10:44:20ZThe application of statistical methodology to the analysis of time-resolved X-ray diffraction dataJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e81eec9e-b714-4c29-b254-59b0c21d534dEnglishSymplectic Elements at Oxford2011Burley, JO'Hare, DWilliams, GWe demonstrate for the first time the application of Principal Component Analysis (PCA) to the analysis of time-resolved energy-dispersive X-ray diffraction data. Previously well-characterised model systems are studied. PCA is shown to offer significant advantages over traditional curve-fitting methods in terms of speed and lack of potential user bias. © 2011 The Royal Society of Chemistry. |
| spellingShingle | Burley, J O'Hare, D Williams, G The application of statistical methodology to the analysis of time-resolved X-ray diffraction data |
| title | The application of statistical methodology to the analysis of time-resolved X-ray diffraction data |
| title_full | The application of statistical methodology to the analysis of time-resolved X-ray diffraction data |
| title_fullStr | The application of statistical methodology to the analysis of time-resolved X-ray diffraction data |
| title_full_unstemmed | The application of statistical methodology to the analysis of time-resolved X-ray diffraction data |
| title_short | The application of statistical methodology to the analysis of time-resolved X-ray diffraction data |
| title_sort | application of statistical methodology to the analysis of time resolved x ray diffraction data |
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