Characterization of a direct detection device imaging camera for transmission electron microscopy

The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The D...

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Main Authors: Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N
Format: Journal article
Language:English
Published: Elsevier 2010
Subjects:
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author Milazzo, A
Moldovan, G
Lanman, J
Jin, L
Bouwer, J
Klienfelder, S
Peltier, S
Ellisman, M
Kirkland, A
Xuong, N
author_facet Milazzo, A
Moldovan, G
Lanman, J
Jin, L
Bouwer, J
Klienfelder, S
Peltier, S
Ellisman, M
Kirkland, A
Xuong, N
author_sort Milazzo, A
collection OXFORD
description The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras.
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spelling oxford-uuid:e829b223-ab6a-4edd-af79-a6e6856214da2022-03-27T10:44:41ZCharacterization of a direct detection device imaging camera for transmission electron microscopyJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:e829b223-ab6a-4edd-af79-a6e6856214daMaterials SciencesEnglishOxford University Research Archive - ValetElsevier2010Milazzo, AMoldovan, GLanman, JJin, LBouwer, JKlienfelder, SPeltier, SEllisman, MKirkland, AXuong, NThe complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras.
spellingShingle Materials Sciences
Milazzo, A
Moldovan, G
Lanman, J
Jin, L
Bouwer, J
Klienfelder, S
Peltier, S
Ellisman, M
Kirkland, A
Xuong, N
Characterization of a direct detection device imaging camera for transmission electron microscopy
title Characterization of a direct detection device imaging camera for transmission electron microscopy
title_full Characterization of a direct detection device imaging camera for transmission electron microscopy
title_fullStr Characterization of a direct detection device imaging camera for transmission electron microscopy
title_full_unstemmed Characterization of a direct detection device imaging camera for transmission electron microscopy
title_short Characterization of a direct detection device imaging camera for transmission electron microscopy
title_sort characterization of a direct detection device imaging camera for transmission electron microscopy
topic Materials Sciences
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