Characterization of a direct detection device imaging camera for transmission electron microscopy

Characterization of a direct detection device imaging camera for transmission electron microscopy

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The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The D...

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Bibliographic Details
Main Authors:	Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N
Format:	Journal article
Language:	English
Published:	Elsevier 2010
Subjects:	Materials Sciences

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