Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy

In quantitative scanning transmission electron microscopy (STEM), scattering cross-sections have been shown to be very sensitive to the number of atoms in a column and its composition. They correspond to the integrated intensity over the atomic column and they outperform other measures. As compared...

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Bibliographic Details
Main Authors:	Martinez, G, Van Den Bos, K, Alania, M, Nellist, P, Van Aert, S
Format:	Journal article
Language:	English
Published:	Elsevier 2018

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