Selection rules for Bloch wave scattering for HREM imaging of imperfect crystals along symmetry axes

Liknande verk

• Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
  av: Nellist, P, et al.
  Publicerad: (2008)
• A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
  av: Cosgriff, E, et al.
  Publicerad: (2007)
• Aberration-corrected HREM/STEM for semiconductor research
  av: Hetherington, C, et al.
  Publicerad: (2005)
• Resolution extension and exit wave reconstruction in complex HREM.
  av: Hsieh, W, et al.
  Publicerad: (2004)
• Hyperbolic polaritonic crystals with configurable low-symmetry Bloch modes
  av: Lv, Jiangtao, et al.
  Publicerad: (2023)