Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass
We report on the characterization of the growth of vacuum-deposited zinc phthalocyanine (ZnPc) thin films on glass through a combination of in situ grazing incidence x-ray scattering, x-ray reflectivity, and atomic force microscopy. We found that the growth at room temperature proceeds via the forma...
| Main Authors: | , , , , , |
|---|---|
| Format: | Journal article |
| Jezik: | English |
| Izdano: |
American Physical Society
2022
|
| _version_ | 1826307498659807232 |
|---|---|
| author | Derrien, TL Lauritzen, AE Kaienburg, P Hancox, E Nicklin, C Riede, MK |
| author_facet | Derrien, TL Lauritzen, AE Kaienburg, P Hancox, E Nicklin, C Riede, MK |
| author_sort | Derrien, TL |
| collection | OXFORD |
| description | We report on the characterization of the growth of vacuum-deposited zinc phthalocyanine (ZnPc) thin films on glass through a combination of in situ grazing incidence x-ray scattering, x-ray reflectivity, and atomic force microscopy. We found that the growth at room temperature proceeds via the formation of two structurally unique substrate-induced interfacial layers, followed by the growth of the
γ
-ZnPc polymorph thereafter (thickness
≈
1.0
nm). As the growth of the bulk
γ
-ZnPc progresses, a substantial out-of-plane lattice strain (
≈
15
%
relative to
γ
-ZnPc powder) is continually relaxed during the thin film growth. The rate of strain relaxation was slowed after a thickness of
≈
13
nm, corresponding to the transition from layer growth to island growth. The findings reveal the real-time microstructural evolution of ZnPc and highlight the importance of substrate-induced strain on thin film growth. |
| first_indexed | 2024-03-07T07:03:59Z |
| format | Journal article |
| id | oxford-uuid:ed25ad31-825b-4b4e-bd50-bc18df1c622b |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T07:03:59Z |
| publishDate | 2022 |
| publisher | American Physical Society |
| record_format | dspace |
| spelling | oxford-uuid:ed25ad31-825b-4b4e-bd50-bc18df1c622b2022-04-01T14:08:23ZInterfacial rearrangements and strain evolution in the thin film growth of ZnPc on glassJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:ed25ad31-825b-4b4e-bd50-bc18df1c622bEnglishSymplectic ElementsAmerican Physical Society2022Derrien, TLLauritzen, AEKaienburg, PHancox, ENicklin, CRiede, MKWe report on the characterization of the growth of vacuum-deposited zinc phthalocyanine (ZnPc) thin films on glass through a combination of in situ grazing incidence x-ray scattering, x-ray reflectivity, and atomic force microscopy. We found that the growth at room temperature proceeds via the formation of two structurally unique substrate-induced interfacial layers, followed by the growth of the γ -ZnPc polymorph thereafter (thickness ≈ 1.0 nm). As the growth of the bulk γ -ZnPc progresses, a substantial out-of-plane lattice strain ( ≈ 15 % relative to γ -ZnPc powder) is continually relaxed during the thin film growth. The rate of strain relaxation was slowed after a thickness of ≈ 13 nm, corresponding to the transition from layer growth to island growth. The findings reveal the real-time microstructural evolution of ZnPc and highlight the importance of substrate-induced strain on thin film growth. |
| spellingShingle | Derrien, TL Lauritzen, AE Kaienburg, P Hancox, E Nicklin, C Riede, MK Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass |
| title | Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass |
| title_full | Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass |
| title_fullStr | Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass |
| title_full_unstemmed | Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass |
| title_short | Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass |
| title_sort | interfacial rearrangements and strain evolution in the thin film growth of znpc on glass |
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