Interfacial rearrangements and strain evolution in the thin film growth of ZnPc on glass

We report on the characterization of the growth of vacuum-deposited zinc phthalocyanine (ZnPc) thin films on glass through a combination of in situ grazing incidence x-ray scattering, x-ray reflectivity, and atomic force microscopy. We found that the growth at room temperature proceeds via the forma...

Ausführliche Beschreibung

Bibliographische Detailangaben
Hauptverfasser: Derrien, TL, Lauritzen, AE, Kaienburg, P, Hancox, E, Nicklin, C, Riede, MK
Format: Journal article
Sprache:English
Veröffentlicht: American Physical Society 2022