Filamentary high-resolution electrical probes for nanoengineering
Confining electric fields to a nanoscale region is challenging yet crucial for applications such as high resolution probing of electrical properties of materials and electric-field manipulation of nanoparticles. State-of-the-art techniques involving atomic force microscopy typically have a lateral r...
| Հիմնական հեղինակներ: | , , , , , , , |
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| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
American Chemical Society
2020
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| Խորագրեր: |