Cita APA (7a ed.)

Grovenor, C., Cerezo, A., & Smith, G. (1983). FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics.

Cita Chicago Style (17a ed.)

Grovenor, C., A. Cerezo, y G. Smith. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

Cita MLA (9a ed.)

Grovenor, C., et al. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.