Cita APA

Grovenor, C., Cerezo, A., & Smith, G. (1983). FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics.

Citación estilo Chicago

Grovenor, C., A. Cerezo, and G. Smith. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

Cita MLA

Grovenor, C., et al. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.