APA(7版)引用形式

Grovenor, C., Cerezo, A., & Smith, G. (1983). FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics.

Chicagoスタイル(17版)引用形式

Grovenor, C., A. Cerezo, , G. Smith. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

MLA(9版)引用形式

Grovenor, C., et al. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

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