APA (7e ed.) Bronvermelding

Grovenor, C., Cerezo, A., & Smith, G. (1983). FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics.

Chicago (17e ed.) Bronvermelding

Grovenor, C., A. Cerezo, en G. Smith. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

MLA (9e ed.) Bronvermelding

Grovenor, C., et al. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.