APA引文

Grovenor, C., Cerezo, A., & Smith, G. (1983). FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics.

芝加哥风格引文

Grovenor, C., A. Cerezo, 与 G. Smith. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

MLA引文

Grovenor, C., et al. FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS. Inst of Physics, 1983.

警告：这些引文格式不一定是100％准确.