FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Ижил төстэй зүйлс

• RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
  -н: Grovenor, C, зэрэг
  Хэвлэсэн: (1985)
• FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
  -н: Godfrey, T, зэрэг
  Хэвлэсэн: (1989)
• FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
  -н: Rose, J, зэрэг
  Хэвлэсэн: (1986)
• RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
  -н: Grovenor, C, зэрэг
  Хэвлэсэн: (1990)
• RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
  -н: Grovenor, C, зэрэг
  Хэвлэсэн: (1990)