FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Inst of Physics
1983
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| _version_ | 1826303809335328768 |
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| author | Grovenor, C Cerezo, A Smith, G |
| author_facet | Grovenor, C Cerezo, A Smith, G |
| author_sort | Grovenor, C |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-07T06:08:19Z |
| format | Journal article |
| id | oxford-uuid:ee9b3d16-d98c-4aa8-adec-89b95f66fc47 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T06:08:19Z |
| publishDate | 1983 |
| publisher | Inst of Physics |
| record_format | dspace |
| spelling | oxford-uuid:ee9b3d16-d98c-4aa8-adec-89b95f66fc472022-03-27T11:33:59ZFIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALSJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:ee9b3d16-d98c-4aa8-adec-89b95f66fc47EnglishSymplectic Elements at OxfordInst of Physics1983Grovenor, CCerezo, ASmith, G |
| spellingShingle | Grovenor, C Cerezo, A Smith, G FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS |
| title | FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS |
| title_full | FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS |
| title_fullStr | FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS |
| title_full_unstemmed | FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS |
| title_short | FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS |
| title_sort | field ion microscopy and atom probe microanalysis of semiconductor materials |
| work_keys_str_mv | AT grovenorc fieldionmicroscopyandatomprobemicroanalysisofsemiconductormaterials AT cerezoa fieldionmicroscopyandatomprobemicroanalysisofsemiconductormaterials AT smithg fieldionmicroscopyandatomprobemicroanalysisofsemiconductormaterials |