FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

ग्रंथसूची विवरण
मुख्य लेखकों:	Grovenor, C, Cerezo, A, Smith, G
स्वरूप:	Journal article
भाषा:	English
प्रकाशित:	Inst of Physics 1983

समान संसाधन

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
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द्वारा: Grovenor, C, और अन्य
प्रकाशित: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
द्वारा: Grovenor, C, और अन्य
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APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
द्वारा: Miller, M, और अन्य
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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द्वारा: Cerezo, A, और अन्य
प्रकाशित: (1988)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
द्वारा: Smith, G, और अन्य
प्रकाशित: (1994)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
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Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy.
द्वारा: Sha, G, और अन्य
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AN INVESTIGATION OF A RAPIDLY SOLIDIFIED AL-CR ALLOY USING FIELD-ION MICROSCOPY ATOM PROBE ANALYSIS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
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Microanalysis at the atomic level
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Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
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Electron and microscopy and microanalysis ; principles and applications /
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Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
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