FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

Bibliografiske detaljer
Main Authors:	Grovenor, C, Cerezo, A, Smith, G
Format:	Journal article
Sprog:	English
Udgivet:	Inst of Physics 1983

Lignende værker

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
af: Grovenor, C, et al.
Udgivet: (1985)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
af: Godfrey, T, et al.
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FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
af: Rose, J, et al.
Udgivet: (1986)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
af: Grovenor, C, et al.
Udgivet: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
af: Grovenor, C, et al.
Udgivet: (1990)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Cerezo, A, et al.
Udgivet: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Grovenor, C, et al.
Udgivet: (1987)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
af: Miller, M, et al.
Udgivet: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
af: Cerezo, A, et al.
Udgivet: (1988)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
af: Smith, G, et al.
Udgivet: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
af: Cerezo, A, et al.
Udgivet: (1994)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
af: Grovenor, C, et al.
Udgivet: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
af: Cerezo, A, et al.
Udgivet: (1986)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
af: Beaven, P, et al.
Udgivet: (1980)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
af: Smith, G
Udgivet: (1987)

ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A CO-FREE MARAGING-STEEL
af: Sha, W, et al.
Udgivet: (1991)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
af: Larson, D, et al.
Udgivet: (1999)

A FIELD-ION MICROSCOPY AND ATOM PROBE STUDY OF AGING BEHAVIOR OF A CO-BEARING MARAGING-STEEL
af: Sha, W, et al.
Udgivet: (1989)

Electron microscopy and microanalysis of crystalline materials/
af: 224259 Belk, J. A.
Udgivet: (1979)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
af: Mackenzie, R, et al.
Udgivet: (1990)

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
af: Larson, D, et al.
Udgivet: (1998)

ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A MODEL FE-NI-CO-MO MARAGING-STEEL
af: Sha, W, et al.
Udgivet: (1992)

AN INVESTIGATION OF A RAPIDLY SOLIDIFIED AL-CR ALLOY USING FIELD-ION MICROSCOPY ATOM PROBE ANALYSIS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
af: Shollock, B, et al.
Udgivet: (1988)

Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy.
af: Sha, G, et al.
Udgivet: (2005)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
af: Cerezo, A, et al.
Udgivet: (1985)

Microanalysis at the atomic level
af: Pennycook, S, et al.
Udgivet: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
af: Hudson, D, et al.
Udgivet: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1989)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
af: Hono, K., et al.
Udgivet: (1998-01-01)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
af: Mueller, M, et al.
Udgivet: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
af: Mueller, M, et al.
Udgivet: (2012)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1989)

Microscopy and microanalysis [jurnal elektronik]

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
af: Cerezo, A, et al.
Udgivet: (1988)

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography.
af: Dagan, M, et al.
Udgivet: (2015)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
af: Müller, M, et al.
Udgivet: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
af: Muller, M, et al.
Udgivet: (2010)

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography
af: Dagan, M, et al.
Udgivet: (2015)

Electron and microscopy and microanalysis ; principles and applications /
af: 184792 Murr, Lawrence E.
Udgivet: (1982)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
af: Cerezo, A, et al.
Udgivet: (2001)