FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

書誌詳細
主要な著者:	Grovenor, C, Cerezo, A, Smith, G
フォーマット:	Journal article
言語:	English
出版事項:	Inst of Physics 1983

類似資料

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
著者:: Grovenor, C, 等
出版事項: (1985)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
著者:: Godfrey, T, 等
出版事項: (1989)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
著者:: Rose, J, 等
出版事項: (1986)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
著者:: Grovenor, C, 等
出版事項: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
著者:: Grovenor, C, 等
出版事項: (1990)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
著者:: Cerezo, A, 等
出版事項: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
著者:: Grovenor, C, 等
出版事項: (1987)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
著者:: Miller, M, 等
出版事項: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
著者:: Cerezo, A, 等
出版事項: (1988)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
著者:: Smith, G, 等
出版事項: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
著者:: Cerezo, A, 等
出版事項: (1994)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
著者:: Grovenor, C, 等
出版事項: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
著者:: Cerezo, A, 等
出版事項: (1986)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
著者:: Beaven, P, 等
出版事項: (1980)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
著者:: Smith, G
出版事項: (1987)

ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A CO-FREE MARAGING-STEEL
著者:: Sha, W, 等
出版事項: (1991)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
著者:: Larson, D, 等
出版事項: (1999)

A FIELD-ION MICROSCOPY AND ATOM PROBE STUDY OF AGING BEHAVIOR OF A CO-BEARING MARAGING-STEEL
著者:: Sha, W, 等
出版事項: (1989)

Electron microscopy and microanalysis of crystalline materials/
著者:: 224259 Belk, J. A.
出版事項: (1979)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
著者:: Mackenzie, R, 等
出版事項: (1990)

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
著者:: Larson, D, 等
出版事項: (1998)

ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A MODEL FE-NI-CO-MO MARAGING-STEEL
著者:: Sha, W, 等
出版事項: (1992)

AN INVESTIGATION OF A RAPIDLY SOLIDIFIED AL-CR ALLOY USING FIELD-ION MICROSCOPY ATOM PROBE ANALYSIS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
著者:: Shollock, B, 等
出版事項: (1988)

Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy.
著者:: Sha, G, 等
出版事項: (2005)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
著者:: Cerezo, A, 等
出版事項: (1985)

Microanalysis at the atomic level
著者:: Pennycook, S, 等
出版事項: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
著者:: Hudson, D, 等
出版事項: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
著者:: Cerezo, A, 等
出版事項: (1989)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
著者:: Hono, K., 等
出版事項: (1998-01-01)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
著者:: Mueller, M, 等
出版事項: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
著者:: Mueller, M, 等
出版事項: (2012)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
著者:: Cerezo, A, 等
出版事項: (1989)

Microscopy and microanalysis [jurnal elektronik]

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
著者:: Cerezo, A, 等
出版事項: (1988)

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography.
著者:: Dagan, M, 等
出版事項: (2015)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
著者:: Müller, M, 等
出版事項: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
著者:: Muller, M, 等
出版事項: (2010)

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography
著者:: Dagan, M, 等
出版事項: (2015)

Electron and microscopy and microanalysis ; principles and applications /
著者:: 184792 Murr, Lawrence E.
出版事項: (1982)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
著者:: Cerezo, A, 等
出版事項: (2001)