FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS

书目详细资料
Main Authors:	Grovenor, C, Cerezo, A, Smith, G
格式:	Journal article
语言:	English
出版:	Inst of Physics 1983

相似书籍

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
由: Grovenor, C, et al.
出版: (1985)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
由: Godfrey, T, et al.
出版: (1989)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
由: Rose, J, et al.
出版: (1986)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
由: Grovenor, C, et al.
出版: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
由: Grovenor, C, et al.
出版: (1990)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
由: Cerezo, A, et al.
出版: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
由: Grovenor, C, et al.
出版: (1987)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
由: Miller, M, et al.
出版: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
由: Cerezo, A, et al.
出版: (1988)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
由: Smith, G, et al.
出版: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
由: Cerezo, A, et al.
出版: (1994)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
由: Grovenor, C, et al.
出版: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
由: Cerezo, A, et al.
出版: (1986)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
由: Beaven, P, et al.
出版: (1980)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
由: Smith, G
出版: (1987)

ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A CO-FREE MARAGING-STEEL
由: Sha, W, et al.
出版: (1991)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
由: Larson, D, et al.
出版: (1999)

A FIELD-ION MICROSCOPY AND ATOM PROBE STUDY OF AGING BEHAVIOR OF A CO-BEARING MARAGING-STEEL
由: Sha, W, et al.
出版: (1989)

Electron microscopy and microanalysis of crystalline materials/
由: 224259 Belk, J. A.
出版: (1979)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
由: Mackenzie, R, et al.
出版: (1990)

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
由: Larson, D, et al.
出版: (1998)

ATOM PROBE FIELD-ION MICROSCOPY STUDY OF AGING BEHAVIOR OF A MODEL FE-NI-CO-MO MARAGING-STEEL
由: Sha, W, et al.
出版: (1992)

AN INVESTIGATION OF A RAPIDLY SOLIDIFIED AL-CR ALLOY USING FIELD-ION MICROSCOPY ATOM PROBE ANALYSIS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
由: Shollock, B, et al.
出版: (1988)

Field ion microscopy and 3-D atom probe analysis of Al3Zr particles in 7050 Al alloy.
由: Sha, G, et al.
出版: (2005)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
由: Cerezo, A, et al.
出版: (1985)

Microanalysis at the atomic level
由: Pennycook, S, et al.
出版: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
由: Hudson, D, et al.
出版: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
由: Cerezo, A, et al.
出版: (1989)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
由: Hono, K., et al.
出版: (1998-01-01)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
由: Mueller, M, et al.
出版: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
由: Mueller, M, et al.
出版: (2012)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
由: Cerezo, A, et al.
出版: (1989)

Microscopy and microanalysis [jurnal elektronik]

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
由: Cerezo, A, et al.
出版: (1988)

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography.
由: Dagan, M, et al.
出版: (2015)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
由: Müller, M, et al.
出版: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
由: Muller, M, et al.
出版: (2010)

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography
由: Dagan, M, et al.
出版: (2015)

Electron and microscopy and microanalysis ; principles and applications /
由: 184792 Murr, Lawrence E.
出版: (1982)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
由: Cerezo, A, et al.
出版: (2001)