APA (7 ম সংস্করণ) উদ্ধৃতি

Tweddle, D., Shaw, E., Douglas, J., Bonilla, R., Moody, M., Hamer, P., & Wilshaw, P. (2018). Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon. AIP Publishing.

শিকাগো স্টাইল (17 তম সংস্করণ) উদ্ধৃতি

Tweddle, D., E. Shaw, J. Douglas, R. Bonilla, M. Moody, P. Hamer, এবং P. Wilshaw. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.

M.L.A (9 ম সংস্করণ) উদ্ধৃতি

Tweddle, D., et al. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.