Παραπομπή σε μορφή APA (7η εκδ.)

Tweddle, D., Shaw, E., Douglas, J., Bonilla, R., Moody, M., Hamer, P., & Wilshaw, P. (2018). Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon. AIP Publishing.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Tweddle, D., E. Shaw, J. Douglas, R. Bonilla, M. Moody, P. Hamer, και P. Wilshaw. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.

Παραπομπή σε μορφή MLA (9th εκδ.)

Tweddle, D., et al. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.