Cita APA

Tweddle, D., Shaw, E., Douglas, J., Bonilla, R., Moody, M., Hamer, P., & Wilshaw, P. (2018). Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon. AIP Publishing.

Citación estilo Chicago

Tweddle, D., E. Shaw, J. Douglas, R. Bonilla, M. Moody, P. Hamer, and P. Wilshaw. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.

Cita MLA

Tweddle, D., et al. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.