APA ציטוט

Tweddle, D., Shaw, E., Douglas, J., Bonilla, R., Moody, M., Hamer, P., & Wilshaw, P. (2018). Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon. AIP Publishing.

Chicago Style (17th ed.) Citation

Tweddle, D., E. Shaw, J. Douglas, R. Bonilla, M. Moody, P. Hamer, and P. Wilshaw. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.

ציטוט MLA

Tweddle, D., et al. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.