Tweddle, D., Shaw, E., Douglas, J., Bonilla, R., Moody, M., Hamer, P., & Wilshaw, P. (2018). Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon. AIP Publishing.

Tweddle, D., E. Shaw, J. Douglas, R. Bonilla, M. Moody, P. Hamer, and P. Wilshaw. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.

Tweddle, D., et al. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.