APA (7. basım) Alıntı

Tweddle, D., Shaw, E., Douglas, J., Bonilla, R., Moody, M., Hamer, P., & Wilshaw, P. (2018). Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon. AIP Publishing.

Chicago Style (17. basım) Atıf

Tweddle, D., E. Shaw, J. Douglas, R. Bonilla, M. Moody, P. Hamer, ve P. Wilshaw. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.

MLA (9th ed.) Atıf

Tweddle, D., et al. Atom Probe Tomography of Fast-diffusing Impurities and the Effect of Gettering in Multicrystalline Silicon. AIP Publishing, 2018.