QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON

Bibliographic Details
Main Authors: Fell, T, Wilshaw, P
Format: Conference item
Published: 1991
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author Fell, T
Wilshaw, P
author_facet Fell, T
Wilshaw, P
author_sort Fell, T
collection OXFORD
description
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format Conference item
id oxford-uuid:eed232bf-78a8-4891-9383-7613f963a7d7
institution University of Oxford
last_indexed 2024-03-07T06:09:00Z
publishDate 1991
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spelling oxford-uuid:eed232bf-78a8-4891-9383-7613f963a7d72022-03-27T11:35:43ZQUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICONConference itemhttp://purl.org/coar/resource_type/c_5794uuid:eed232bf-78a8-4891-9383-7613f963a7d7Symplectic Elements at Oxford1991Fell, TWilshaw, P
spellingShingle Fell, T
Wilshaw, P
QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
title QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
title_full QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
title_fullStr QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
title_full_unstemmed QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
title_short QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
title_sort quantitative ebic investigations of deformation induced and copper decorated dislocations in silicon
work_keys_str_mv AT fellt quantitativeebicinvestigationsofdeformationinducedandcopperdecorateddislocationsinsilicon
AT wilshawp quantitativeebicinvestigationsofdeformationinducedandcopperdecorateddislocationsinsilicon