Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for...
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| Médium: | Diplomová práce |
| Jazyk: | English |
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2011
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