In situ characterization of an optically thick atom-filled cavity

<p style="text-align:justify;"> A means for precise experimental characterization of the dielectric susceptibility of an atomic gas inside an optical cavity is important for the design and operation of quantum light-matter interfaces, particularly in the context of quantum informati...

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Үндсэн зохиолчид: Munns, JHD, Qiu, C, Ledingham, PM, Walmsley, IA, Nunn, J, Saunders, DJ
Формат: Journal article
Хэвлэсэн: American Physical Society 2016

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