In situ characterization of an optically thick atom-filled cavity
<p style="text-align:justify;"> A means for precise experimental characterization of the dielectric susceptibility of an atomic gas inside an optical cavity is important for the design and operation of quantum light-matter interfaces, particularly in the context of quantum informati...
| मुख्य लेखकों: | , , , , , |
|---|---|
| स्वरूप: | Journal article |
| प्रकाशित: |
American Physical Society
2016
|