In situ characterization of an optically thick atom-filled cavity
<p style="text-align:justify;"> A means for precise experimental characterization of the dielectric susceptibility of an atomic gas inside an optical cavity is important for the design and operation of quantum light-matter interfaces, particularly in the context of quantum informati...
| 主要な著者: | , , , , , |
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| フォーマット: | Journal article |
| 出版事項: |
American Physical Society
2016
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