Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM

類似資料

• Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
  著者:: Behan, G, 等
  出版事項: (2009)
• Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
  著者:: Nellist, P, 等
  出版事項: (2008)
• A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
  著者:: Cosgriff, E, 等
  出版事項: (2007)
• Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
  著者:: Cosgriff, E, 等
  出版事項: (2010)
• Materials analysis by aberration-corrected STEM
  著者:: Krivanek, O, 等
  出版事項: (2005)