Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission
X-ray emission spectroscopy is a well-established technique used to study continuum lowering in dense plasmas. It relies on accurate atomic physics models to robustly reproduce high-resolution emission spectra, and depends on our ability to identify spectroscopic signatures such as emission lines or...
| প্রধান লেখক: | , , |
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| বিন্যাস: | Journal article |
| প্রকাশিত: |
Springer Nature
2018
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| _version_ | 1826304819052150784 |
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| author | Kasim, MF Wark, JS Vinko, SM |
| author_facet | Kasim, MF Wark, JS Vinko, SM |
| author_sort | Kasim, MF |
| collection | OXFORD |
| description | X-ray emission spectroscopy is a well-established technique used to study continuum lowering in dense plasmas. It relies on accurate atomic physics models to robustly reproduce high-resolution emission spectra, and depends on our ability to identify spectroscopic signatures such as emission lines or ionization edges of individual charge states within the plasma. Here we describe a method that forgoes these requirements, enabling the validation of different continuum lowering models based solely on the total intensity of plasma emission in systems driven by narrow-bandwidth x-ray pulses across a range of wavelengths. The method is tested on published Al spectroscopy data and applied to the new case of solid-density partially-ionized Fe plasmas, where extracting ionization edges directly is precluded by the significant overlap of emission from a wide range of charge states. |
| first_indexed | 2024-03-07T06:23:33Z |
| format | Journal article |
| id | oxford-uuid:f37c1444-62c8-4bbd-87a9-c4b7dc4f2da8 |
| institution | University of Oxford |
| last_indexed | 2024-03-07T06:23:33Z |
| publishDate | 2018 |
| publisher | Springer Nature |
| record_format | dspace |
| spelling | oxford-uuid:f37c1444-62c8-4bbd-87a9-c4b7dc4f2da82022-03-27T12:12:31ZValidating continuum lowering models via multi-wavelength measurements of integrated x-ray emissionJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:f37c1444-62c8-4bbd-87a9-c4b7dc4f2da8Symplectic Elements at OxfordSpringer Nature2018Kasim, MFWark, JSVinko, SMX-ray emission spectroscopy is a well-established technique used to study continuum lowering in dense plasmas. It relies on accurate atomic physics models to robustly reproduce high-resolution emission spectra, and depends on our ability to identify spectroscopic signatures such as emission lines or ionization edges of individual charge states within the plasma. Here we describe a method that forgoes these requirements, enabling the validation of different continuum lowering models based solely on the total intensity of plasma emission in systems driven by narrow-bandwidth x-ray pulses across a range of wavelengths. The method is tested on published Al spectroscopy data and applied to the new case of solid-density partially-ionized Fe plasmas, where extracting ionization edges directly is precluded by the significant overlap of emission from a wide range of charge states. |
| spellingShingle | Kasim, MF Wark, JS Vinko, SM Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission |
| title | Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission |
| title_full | Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission |
| title_fullStr | Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission |
| title_full_unstemmed | Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission |
| title_short | Validating continuum lowering models via multi-wavelength measurements of integrated x-ray emission |
| title_sort | validating continuum lowering models via multi wavelength measurements of integrated x ray emission |
| work_keys_str_mv | AT kasimmf validatingcontinuumloweringmodelsviamultiwavelengthmeasurementsofintegratedxrayemission AT warkjs validatingcontinuumloweringmodelsviamultiwavelengthmeasurementsofintegratedxrayemission AT vinkosm validatingcontinuumloweringmodelsviamultiwavelengthmeasurementsofintegratedxrayemission |