Reduced microwave attenuation in coplanar waveguides using deep level impurity compensated Czochralski-silicon substrates

We show that deep level doping of Czochralski-grown silicon wafers is capable of providing high resistivity handle wafers suitable for radio frequency integrated circuits. Starting from n-type Czochralski silicon wafers having a nominal resistivity of 50 Ω cm, we use ion implantation and subsequent...

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Bibliographic Details
Main Authors: Abuelgasim, A, Mallik, K, Ashburn, P, Jordan, D, Wilshaw, P, Falster, R, Groot, d
Format: Journal article
Language:English
Published: 2011