TWO-DIMENSIONAL CONDUCTIVITY IN THE CONTACT REGIONS OF SILICON MOSFETS
Váldodahkkit: | Kressrogers, E, Nicholas, R, Englert, T, Pepper, M |
---|---|
Materiálatiipa: | Journal article |
Almmustuhtton: |
1980
|
Geahča maid
-
CYCLOTRON-RESONANCE STUDIES ON BULK AND TWO-DIMENSIONAL CONDUCTION ELECTRONS IN INSE
Dahkki: Kressrogers, E, et al.
Almmustuhtton: (1982) -
THE CYCLOTRON-RESONANCE LINEWIDTH IN TWO-DIMENSIONAL ELECTRON ACCUMULATION LAYERS IN INSE
Dahkki: Kressrogers, E, et al.
Almmustuhtton: (1983) -
ELECTRON-TRANSPORT IN SILICON INVERSION-LAYERS AT HIGH MAGNETIC-FIELDS AND THE INFLUENCE OF SUBSTRATE BIAS
Dahkki: Nicholas, R, et al.
Almmustuhtton: (1980) -
TWO-DIMENSIONAL BEHAVIOR DUE TO ELECTRONS BOUND AT DEFECTS IN INSE
Dahkki: Nicholas, R, et al.
Almmustuhtton: (1982) -
Two-dimensional analytical threshold voltage model of nanoscale strained silicon MOSFET with tri-material gate /
Dahkki: Muhamad Syahir Tumaran, 1987-, et al.
Almmustuhtton: (2010)