Direct sub-angstrom imaging of a crystal lattice.
Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a fe...
| Main Authors: | , , , , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2004
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| _version_ | 1797103846392070144 |
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| author | Nellist, P Chisholm, M Dellby, N Krivanek, O Murfitt, M Szilagyi, Z Lupini, A Borisevich, A Sides, W Pennycook, S |
| author_facet | Nellist, P Chisholm, M Dellby, N Krivanek, O Murfitt, M Szilagyi, Z Lupini, A Borisevich, A Sides, W Pennycook, S |
| author_sort | Nellist, P |
| collection | OXFORD |
| description | Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are separated by less than 0.1 nanometer. |
| first_indexed | 2024-03-07T06:25:47Z |
| format | Journal article |
| id | oxford-uuid:f43ef44f-4cdc-4229-bb82-6f197f20bf64 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T06:25:47Z |
| publishDate | 2004 |
| record_format | dspace |
| spelling | oxford-uuid:f43ef44f-4cdc-4229-bb82-6f197f20bf642022-03-27T12:18:17ZDirect sub-angstrom imaging of a crystal lattice.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:f43ef44f-4cdc-4229-bb82-6f197f20bf64EnglishSymplectic Elements at Oxford2004Nellist, PChisholm, MDellby, NKrivanek, OMurfitt, MSzilagyi, ZLupini, ABorisevich, ASides, WPennycook, SDespite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are separated by less than 0.1 nanometer. |
| spellingShingle | Nellist, P Chisholm, M Dellby, N Krivanek, O Murfitt, M Szilagyi, Z Lupini, A Borisevich, A Sides, W Pennycook, S Direct sub-angstrom imaging of a crystal lattice. |
| title | Direct sub-angstrom imaging of a crystal lattice. |
| title_full | Direct sub-angstrom imaging of a crystal lattice. |
| title_fullStr | Direct sub-angstrom imaging of a crystal lattice. |
| title_full_unstemmed | Direct sub-angstrom imaging of a crystal lattice. |
| title_short | Direct sub-angstrom imaging of a crystal lattice. |
| title_sort | direct sub angstrom imaging of a crystal lattice |
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