Nelson, A., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., . . . Pelka, J. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optical Society of American (OSA).
Chicago-Zitierstil (17. Ausg.)Nelson, A., et al. Soft X-ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions. Optical Society of American (OSA), 2009.
MLA-Zitierstil (9. Ausg.)Nelson, A., et al. Soft X-ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions. Optical Society of American (OSA), 2009.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.