Nelson, A., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., . . . Pelka, J. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optical Society of American (OSA).
Chicago-viite (17. p.)Nelson, A., et al. Soft X-ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions. Optical Society of American (OSA), 2009.
MLA-viite (9. p.)Nelson, A., et al. Soft X-ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions. Optical Society of American (OSA), 2009.
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