Nelson, A., Toleikis, S., Chapman, H., Bajt, S., Krzywinski, J., Chalupsky, J., . . . Pelka, J. (2009). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optical Society of American (OSA).
Chicago Style (17th ed.) CitationNelson, A., et al. Soft X-ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions. Optical Society of American (OSA), 2009.
MLA引文Nelson, A., et al. Soft X-ray Free Electron Laser Microfocus for Exploring Matter Under Extreme Conditions. Optical Society of American (OSA), 2009.
警告：這些引文格式不一定是100％准確.