Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.

Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The...

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书目详细资料
Main Authors: Nelson, A, Toleikis, S, Chapman, H, Bajt, S, Krzywinski, J, Chalupsky, J, Juha, L, Cihelka, J, Hajkova, V, Vysin, L, Burian, T, Kozlova, M, Fäustlin, R, Nagler, B, Vinko, S, Whitcher, T, Dzelzainis, T, Renner, O, Saksl, K, Khorsand, A, Heimann, P, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J
格式: Journal article
语言:English
出版: Optical Society of American (OSA) 2009
实物特征
总结:We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) - PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of < or =1 microm. Observations were correlated with simulations of best focus to provide further relevant information.

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