Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The...
Үндсэн зохиолчид: | Nelson, A, Toleikis, S, Chapman, H, Bajt, S, Krzywinski, J, Chalupsky, J, Juha, L, Cihelka, J, Hajkova, V, Vysin, L, Burian, T, Kozlova, M, Fäustlin, R, Nagler, B, Vinko, S, Whitcher, T, Dzelzainis, T, Renner, O, Saksl, K, Khorsand, A, Heimann, P, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J |
---|---|
Формат: | Journal article |
Хэл сонгох: | English |
Хэвлэсэн: |
Optical Society of American (OSA)
2009
|
Ижил төстэй зүйлс
Ижил төстэй зүйлс
-
Achieving microfocus of the 13.5-NM flash beam for exploring matter under extreme conditions
-н: Nelson, A, зэрэг
Хэвлэсэн: (2009) -
Decay of cystalline order and equilibration during the solid-to-plasma transition induced by 20-fs microfocused 92-eV free-electron-laser pulses.
-н: Galtier, E, зэрэг
Хэвлэсэн: (2011) -
Decay of Cystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses
-н: Galtier, E, зэрэг
Хэвлэсэн: (2011) -
Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
-н: Cihelka, J, зэрэг
Хэвлэсэн: (2009) -
Perspective for high energy density studies using x-ray free electron lasers
-н: Lee, R, зэрэг
Хэвлэсэн: (2009)