Super-resolution microscopy with spatial modes of light
<p>The resolution of imaging devices is ultimately limited by the diffraction of light. This limit can be circumvented by exploiting near-field phenomena, non-linearities of the sample or specific illumination schemes, which led to the recent explosion of optical super-resolution techniques. H...
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| Muut tekijät: | |
| Aineistotyyppi: | Opinnäyte |
| Kieli: | English |
| Julkaistu: |
2021
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| Aiheet: |