Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

Bibliografiset tiedot
Päätekijät:	Behan, G, Nellist, P
Aineistotyyppi:	Conference item
Julkaistu:	2008

Samankaltaisia teoksia

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